More Resources
By Alexandra Szynkarski • August 3, 2012
Ipek Ozkaya (senior member of the SEI technical staff) recently held a webinar for the SEI Agile Discussion Forum where she presented the relationship between … read more
By Alexandra Szynkarski • June 22, 2012
Below is an updated set of slides from a webinar presented by IEEE Software and Boeing on how to identify and manage technical debt. … read more
By Alexandra Szynkarski • June 6, 2012
Technical debt is often characterized as design or code tradeoffs. At the 3rd International Workshop on Managing Technical Debt, Neil Ernst discussed how shortcuts … read more
By Alexandra Szynkarski • May 16, 2012
Date: Wednesday, May 30, 2012
Location: Brussels, Belgium
The annual CIO Conference provides the opportunity to hear from C-level executives on the importance of IT technical … read more
By Alexandra Szynkarski • May 15, 2012
The IEEE Computer Society and IEEE Software magazine come together once a year to present a one-day Software Experts Summit. This year’s summit will … read more
By Alexandra Szynkarski • May 14, 2012
Dr. Bill Curtis – Senior Vice President and Chief Scientist with CAST – lays out the “Technical Debt Management Cycle”, a 7-step process for … read more
By Alexandra Szynkarski • May 10, 2012
This presentation is from Fadi Stephan, agile coach, trainer and consultant with Washington-DC based Excella, and was presented at the 2012 Atlanta Scrum Gathering.
Managing … read more
By Alexandra Szynkarski • May 9, 2012
Date: Tuesday, May 15, 2012
Time: 11:00 AM – 12:30 PM EDT
Duration: 1 hour 30 min
Credits: 1 PDU Category A – Free PDU
In this webinar, … read more
By Alexandra Szynkarski • May 7, 2012
Last year, Dr. Carolyn Seaman and Dr. Nico Zazworka hosted an extremely informative webinar on “Managing and Measuring Technical Debt” as part of the … read more
By Alexandra Szynkarski • April 13, 2012
Date: Wednesday, May 9, 2012
Time: 10:00 AM PT / 1:00 PM ET / 17:00 GMT (Duration: 1 hour)
Who should attend: Managers, Technical Managers, Technical … read more